Use SiP (System in Package) Module rather than the scheme of DCA (Direct-Chip-Attachment):
1) If system-maker obtains Known Good Modules from module vendor,
•he can reduce system defects-per-million
•he can reduce system test-time
2) If system-maker obtains Small Form Factor Modules with Low Profile from module vendor,
•he can reduce the occupied area of the regarding circuits without sacrificing the thickness of them
Thursday, March 8, 2007
How does SiP Module differ from the scheme of DCA
Labels:
DCA,
DPM,
KGM,
LP,
occupied area,
profile,
SFF,
SiP module,
Test Time,
Thickness
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